标题:Influence of sapphire substrate thickness on the characteristics of AlGaN/AlN/GaN heterostructure field-effect transistors
作者:Yang, Ming;Lin, Zhaojun;Zhao, Jingtao;Wang, Yutang;Li, Zhiyuan;Lv, Yuanjie;Feng, Zhihong
作者机构:Shandong Univ, Sch Phys, Jinan 250100, Peoples R China;Shandong Univ, Sch Phys, Jinan 250100, Peoples R China;Shandong Univ, Sch
来源:Superlattices and microstructures
出版年:2015
页码:43-49
关键词:AlGaN/AlN/GaN HFETs;Sapphire substrate thickness;Strain
摘要:A standard AlGaN/AlN/GaN heterostructure field-effect transistor (HFET) on a 420 mu m thick sapphire substrate was fabricated, and then the sapphire substrate was thinned to several different thicknesses by grinding. When the remaining substrate thickness is more than 170 mu m, the characteristics of the substrate thinned AlGaN/AlN/GaN HFET are almost the same as the original device. However, when the substrate thickness is less than 170 mu m, the drain-to-source current, the threshold voltage, and the electron mobility of the two-dimensional electron gas (2DEG) in the channel are varied compared to the original one. It is attributed to the shrinkage of the GaN layer with the reduction of substrate thickness, which induces the decrease of both the 2DEG sheet density and the polarization charge sheet density, and a possible increase of dislocation scattering and the reduction of polarization Coulomb field scattering. (C) 2015 Elsevier Ltd. All rights reserved.
资源类型:期刊论文
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