标题:Analysis on block-centered finite differences of numerical simulation of semiconductor device detector
作者:Yuan, Yirang; Liu, Yunxin; Li, Changfeng; Sun, Tongjun; Ma, Liqin
作者机构:[Yuan, Yirang; Liu, Yunxin; Li, Changfeng; Sun, Tongjun] Shandong Univ, Inst Math, Jinan 250100, Peoples R China.; [Li, Changfeng] Shandong Univ, Sc 更多
通讯作者:Yuan, Yirang
通讯作者地址:[Yuan, YR]Shandong Univ, Inst Math, Jinan 250100, Peoples R China.
来源:APPLIED MATHEMATICS AND COMPUTATION
出版年:2016
卷:279
页码:1-15
DOI:10.1016/j.amc.2016.01.011
关键词:Three-dimensional photoconduction detector; Porous flow model;; Block-centered differences on nonuniform partition; Super-convergent; numerical analysis; Numerical simulation
摘要:A finite difference scheme on block-centered method is presented on nonuniform partition to simulate numerically three-dimensional transient problems of semiconductor detector of photoconduction. Applying the method of mixed finite element, the principle of duality, the induction hypothesis, the prior error theory of differential equations and other special techniques, we give error estimates of second-order accuracy in I-2-norm. The numerical simulation is super-convergent for the electric field intensity, really important in actual applications. (C) 2016 Elsevier Inc. All rights reserved.
收录类别:EI;SCOPUS;SCIE
WOS核心被引频次:2
Scopus被引频次:2
资源类型:期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84966318757&doi=10.1016%2fj.amc.2016.01.011&partnerID=40&md5=84d7f4648160713acb63346f614d49f4
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