标题:Thermal Effect Characterization of Multiple Finger Power HBT: Thermal Resistance Matrix
作者:Liang, Chen
通讯作者:Liang, C;Liang, C;Liang, C
作者机构:[Liang, Chen] Taishan Univ, Sch Phys & Elect Engineeing, Tainan 271000, Taiwan.; [Liang, Chen] Hongan Grp Co Ltd, Wendeng 264400, Shandong, Peoples 更多
会议名称:IEEE Information Technology, Networking, Electronic and Automation Control Conference (ITNEC)
会议日期:MAY 20-22, 2016
来源:2016 IEEE INFORMATION TECHNOLOGY, NETWORKING, ELECTRONIC AND AUTOMATION CONTROL CONFERENCE (ITNEC)
出版年:2016
页码:182-185
关键词:Heterojunction bipolar transistors; Thermal resistance; Emitter finger; spacing
摘要:The thermal resistance model of multi-finger HBTs is established, and then the expressions of self-heating thermal resistance and coupling thermal resistance are derived. Self-heating thermal resistance is used to characterize the self-heating effect, coupling thermal resistance is used to characterize the thermal coupling effect, furthermore, thermal resistance matrix is used to characterize the thermal effect of multi-finger HBTs. Results show that thermal resistance matrix can be used to characterize the thermal effect of multi-finger HBT, and the temperature distribution of HBT can be got by the thermal resistance distribution.
收录类别:CPCI-S
WOS核心被引频次:1
资源类型:会议论文
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