标题:Growth defects in langasite crystals observed with white beam synchrotron radiation topography
作者:Wang, XP; Wang, JY; Hu, XB; Zhang, JX; Zhao, HY; Huang, WX; Zhu, PP
通讯作者:Wang, X.
作者机构:[Wang, X] State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China;[ Wang, J] State Key Laboratory of Crystal Materials, Sh 更多
会议名称:3rd Asian Conference on Crystal Growth and Crystal Technology (CGCT-3)
会议日期:OCT 16-19, 2005
来源:稀土学报(英文版)
出版年:2006
卷:24
期:SUPPL.
页码:159-161
关键词:Langasite (LGS crystal);growth striation;growth core;dislocation
摘要:Langasite single crystal was grown by the Czochralski method and its perfection was assessed by white beam synchrotron radiation topography. It is found that the growth core and the growth striations are the primary growth defects and they show strong X-ray kinematical contrast in the topographs. Another typical defect in LGS crystal is dislocation. The formation mechanisms of these growth defects in LGS crystals were discussed.
收录类别:CPCI-S;EI;SCOPUS;SCIE
资源类型:会议论文;期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-33745658875&partnerID=40&md5=f661fade083f60d0de0d17b5aae0360e
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