标题:A method for probing the refractive index change in photorefractive crystals
作者:Fu, Min; Gao, Chengyong; Wang, Xu'an; Cui, Yuankai; Dai, Shuwei
作者机构:[Fu, Min; Gao, Chengyong; Cui, Yuankai; Dai, Shuwei] Shandong Univ, Sch Phys, Jinan 250100, Peoples R China.; [Wang, Xu'an] Binzhou Coll, Dept Phys 更多
通讯作者:Gao, C
通讯作者地址:[Gao, CY]Shandong Univ, Sch Phys, Jinan 250100, Peoples R China.
来源:OPTICA APPLICATA
出版年:2013
卷:43
期:4
页码:731-737
DOI:10.5277/oa130409
关键词:Fourier transform profilometry; refractive index change; photorefractive; effect
摘要:A method for probing refractive index changes in photorefractive crystals using an interferometric technique and digital image processing was proposed. Based on equal thickness interference in LiNbO3 crystal and Fourier transform profilometry, we obtained phase value changes in interferograms induced by a photorefractive effect, and further calculated refractive index changes. The maximal values for extraordinary light (e-light) and ordinary light (o-light) are 6.6x10(-4) and 1.2 x 10(-4), respectively.
收录类别:EI;SCOPUS;SCIE
资源类型:期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84901415916&doi=10.5277%2foa130409&partnerID=40&md5=b66b37794a94fabebf524d8ee200fa1b
TOP