标题:Optical study of Tm-doped solid solution (Sc0.5Y0.5)2SiO5crystal
作者:Shi, Jiaojiao ;Liu, Bin ;Zheng, Lihe ;Wang, Qingguo ;Tang, Huili ;Liu, Junfang ;Su, Liangbi ;Wu, Feng ;Zhao, Hengyu ;He, Nuotian ;Li, Na ;Li, Qiu ;Guo 更多
作者机构:[Shi, Jiaojiao ;Liu, Bin ;Wang, Qingguo ;Tang, Huili ;Wu, Feng ;Zhao, Hengyu ;He, Nuotian ;Li, Na ;Li, Qiu ;Guo, Chao ;Xu, Jun ;Ryba-Romanowski, Witol 更多
通讯作者:Wang, Qingguo
来源:Journal of Crystal Growth
出版年:2018
卷:487
页码:83-86
DOI:10.1016/j.jcrysgro.2018.02.006
摘要:Tm-doped (Sc0.5Y0.5)2SiO5(SYSO) crystals were grown by Czochralski method. The UV-VIR-NIR absorption spectra and the near-infrared emission spectra were measured and analysed by the Judd-Ofelt approach. Temperature influence on both absorption and emission spectra has been determined from the data recorded at room temperature and 10 K. It has been found that the structural disorder resulting from dissimilar ionic radii of Sc3+and Y3+in the solid solution (Sc0.5Y0.5)2SiO5crystal brings about a strong inhomogeneous broadening of Tm3+ions spectra. However, it affects the excited state relaxation dynamics inherent to thulium-doped Y2SiO5and Sc2SiO5hosts weakly.
© 2018 Elsevier B.V.
收录类别:EI
资源类型:期刊论文
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