标题:Two-layer microfacet model with diffraction
作者:Chai, Yufei; Xu, Yanning; Xu, Maopu; Wang, Lu
通讯作者:Xu, Yanning
作者机构:[Chai, Yufei; Xu, Yanning; Wang, Lu] Shandong Univ, Sch Software, Jinan 250101, Peoples R China.; [Chai, Yufei; Xu, Yanning; Wang, Lu] Minist Educ, 更多
会议名称:16th International Conference on Computer-Aided Design and Computer Graphics (CAD/Graphics)
会议日期:MAY 05-06, 2019
来源:COMPUTERS & GRAPHICS-UK
出版年:2020
卷:86
页码:71-80
DOI:10.1016/j.cag.2019.08.017
关键词:BSDF; Two-layer; Microfacet; Diffraction
摘要:The bidirectional scattering distribution function (BSDF) describes how light is scattered on a surface. Microfacet-based BSDF models assume that surfaces are a collection of randomly oriented microfacets, describe the distribution probabilities of these microfacets, and plausibly approximate their reflective properties using parameterized expressions. Traditional analytic microfacet models, such as Cook-Torrance (CT) and the Oren-Nayar (ON), ignore the effects of diffraction. The Cook-Torrance diffraction model (CTD) combines the traditional Cook-Torrance model with diffraction effects to better approximate the measured reflectance. However, the effects of diffuse diffraction are ignored in this two-layer microfacet reflectance model. In this paper, We propose a two-layer microfacet reflectance model that combines the effects of specular diffraction with those of diffuse diffraction. The upper layer of our model is the Cook-Torrance microfacet model with diffraction, while the lower layer is the Oren-Nayar microfacet model that considers the effects of diffuse diffraction. Our model yields a better approximation than the CTD model, especially for plastic-like multi-layer materials. In contrast to previous models where the effects of diffraction cannot be controlled, those of our model can be easily manipulated by the coefficient of diffraction roughness. The proposed OND model is based on three techniques: precomputation, convolution computation, and the Gauss-Newton method. (C) 2019 Elsevier Ltd. All rights reserved.
收录类别:CPCI-S;EI;SCOPUS;SCIE
WOS核心被引频次:1
Scopus被引频次:2
资源类型:会议论文;期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85076630298&doi=10.1016%2fj.cag.2019.08.017&partnerID=40&md5=205c96c1f3f9e27cf46ec7c3087edf5b
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