标题:Influence Factors on Clearness and Indexing Rate of EBSD Patterns Obtained from Large Deformation High-purity Ni
作者:Guo Hong; Chen Zhiwei
作者机构:[Guo Hong; Chen Zhiwei] Shandong Univ Technol, Ctr Testing & Anal, Zibo 255049, Shandong, Peoples R China.
会议名称:International Symposium on Low-carbon Economy and Technology Science
会议日期:OCT 29-31, 2010
来源:PROCEEDINGS OF THE 2010 INTERNATIONAL SYMPOSIUM ON LOW-CARBON ECONOMY AND TECHNOLOGY SCIENCE
出版年:2010
页码:136-140
关键词:high-purity Ni; EBSD; pattern; indexing
摘要:Electron back scattered diffraction (EBSD) patterns of high-purity Ni with 98% and 90% deformation and followed by annealing at different temperature and time were obtained by EBSD accessory equipped on field emission scanning electron microscope(FESEM). The influence factors on clearness and indexing rate of Kikuchi patterns were analysed. The results show that the sample preparation, the state of SEM and EBSD as well as the parameters of EBSD test software can affect the clearness of Kikuchi patterns and indexing rate directly. After optmization of the influence factors, 71% and 92% of indexing rate for high-purity Ni with 98% and 90% press deformations were obtained, respectively, and the maxmium indexing rate for the heat treated sample reaches 97%.
收录类别:CPCI-SSH
资源类型:会议论文
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