标题:Low thermal budget lead zirconate titanate thick films integrated on Si for piezo-MEMS applications
作者:Wang, Yingying; Yan, Jing; Cheng, Hongbo; Chen, Ning; Yan, Peng; Ouyang, Jun
作者机构:[Wang, Yingying; Yan, Jing; Ouyang, Jun] Shandong Univ, Sch Mat Sci & Engn, Minist Educ, Key Lab Liquid Solid Struct Evolut & Proc Mat, Jinan 250061, 更多
通讯作者:Ouyang, Jun;Ouyang, J
通讯作者地址:[Ouyang, J]Shandong Univ, Sch Mat Sci & Engn, Minist Educ, Key Lab Liquid Solid Struct Evolut & Proc Mat, Jinan 250061, Peoples R China.
来源:MICROELECTRONIC ENGINEERING
出版年:2020
卷:219
DOI:10.1016/j.mee.2019.111145
关键词:Lead zirconate titanate (PZT); Ferroelectric films; Rapid thermal; processing (RTP); Piezo-MEMS; Energy harvesting; Si
摘要:Piezoelectric cantilevers made from ferroelectric thick films are commonly used as key components in many prototypical piezo-MEMS devices, including sensors, micro-actuators and piezoelectric energy harvesters. In this work, transverse piezoelectric performance of rapid thermal annealed Pb(Zt(0.53)Ti(0.47))O-3 (PZT) thick film (similar to 1-2 mu m) were characterized. These films were sputtered on LaNiO3 buffered Pt/Ti/SiO2/(100) Si substrates at 350 degrees C followed by a rapid thermal process (RTP) with different annealing time (30 s to 15 min) at the high temperature end (700 degrees C), and then patterned into rectangular prism-shaped cantilevers. Such a two-step process yields highly (001)-oriented perovskite PZT films with good overall electrical properties (ferroelectric, dielectric and piezoelectric) close to those of an epitaxial PZT film, yet on a much reduced thermal budget. With the elementary and chemical valence information from EDS and XPS analysis, an optimal annealing time was determined for the PZT thick film cantilevers to have both an outstanding piezoelectric performance (actuating, sensing or energy harvesting), and a good compatibility with the Si technology (a brief exposure to a high temperature). This study promotes the integration of large piezoelectricity into Si-based MEMS.
收录类别:EI;SCOPUS;SCIE
WOS核心被引频次:1
Scopus被引频次:1
资源类型:期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85073934610&doi=10.1016%2fj.mee.2019.111145&partnerID=40&md5=1eab0154b2c8117e2f26c8e0c5e3e56f
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