标题：Fault diagnosis of analog circuit based on multi-test points and multi-feature information
作者：Pan, Qiang ;Yang, Chao
作者机构：[Pan, Qiang ;Yang, Chao ] Electronic Engineering College, Naval University of Engineering, Wuhan 430033, China
会议名称：2012 2nd International Conference on Machinery Electronics and Control Engineering, ICMECE 2012
会议日期：December 29, 2012 - December 30, 2012
来源：Applied Mechanics and Materials
摘要：In the process of use BP neural network to fault diagnosis of analog circuits, the network input which represents fault signature was very important. A given new method which base on multi-points and multi-feature information is taken to construct the original sample set. With this method to construct the original fault signature set, then as the input of BP neural network and train the network. Simulation results show that, the network train with sample set which constructed by this method use in fault diagnosis of analog circuits is better accuracy than traditional methods. Proved the feasibility of this method in fault diagnosis of analog circuits, and offer a new method for fault diagnosis of analog circuits. © (2013) Trans Tech Publications, Switzerland.