标题:Fundamental Insights into the Performance Deterioration of Phosphorene due to Oxidation: A GW Method Investigation
作者:Yi, Zhijun; Ma, Yuchen; Zheng, Yazhuo; Duan, Yifeng; Li, Huichao
作者机构:[Yi, Zhijun; Zheng, Yazhuo; Duan, Yifeng; Li, Huichao] China Univ Min & Technol, Sch Phys Sci & Technol, Xuzhou 221116, Jiangsu, Peoples R China.; [ 更多
通讯作者:Ma, Yuchen;Ma, YC
通讯作者地址:[Ma, YC]Shandong Univ, Sch Chem & Chem Engn, Jinan 250100, Shandong, Peoples R China.
来源:ADVANCED MATERIALS INTERFACES
出版年:2019
卷:6
期:1
DOI:10.1002/admi.201801175
关键词:degradation; electronic structure; GW; phosphorene; quasiparticle
摘要:Degradation of phosphorene due to oxidation in air is extremely harmful to its performance in electronics and optoelectronics. Origin of this phenomenon is still debated and remains elusive. Through the state-of-the-art first-principles theoretical approach, GW method, it is believed that it is actually the vacancy-oxygen complex, formed by a single vacancy and an oxygen impurity nearby, that could lead to deep defect states in the bandgap and therefore deteriorate the performance of phosphorene, while isolated oxygen defects are electronically inactive. This information will be very helpful for protecting phosphorene from deterioration.
收录类别:EI;SCOPUS;SCIE
资源类型:期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85055737494&doi=10.1002%2fadmi.201801175&partnerID=40&md5=63af89d4caa148650b257a99c938ff10
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