标题:A pseudorandom based crystal plasticity finite element method for grain scale polycrystalline material modeling
作者:Ji, Hansong ;Song, Qinghua ;Gupta, Munish Kumar ;Liu, Zhanqiang
作者机构:[Ji, Hansong ;Song, Qinghua ;Gupta, Munish Kumar ;Liu, Zhanqiang ] School of Mechanical Engineering, Key Laboratory of High Efficiency and Clean Mecha 更多
通讯作者:Song, Qinghua
通讯作者地址:[Song, Q] School of Mechanical Engineering, Key Laboratory of High Efficiency and Clean Mechanical Manufacture, Ministry of Education, National Demons 更多
来源:Mechanics of Materials
出版年:2020
卷:144
DOI:10.1016/j.mechmat.2020.103347
关键词:CPFE; Grain scale modeling; Inconel 718 superalloy; Polycrystalline material; Pseudorandom; RVE
摘要:Recently, the grain scale modeling has gained much attention in the area of properties characterization, processing and application for polycrystalline materials at micro-nanometer level. In order to develop the high-quality grain scale representative volume element (RVE) models for polycrystalline materials, this paper proposes a pseudorandom based crystal plasticity finite element (CPFE) modeling method, which can take full advantage of true grain scale information and generate pseudorandom grains. Further, the uniaxial tension experiments, EBSD copying modeling method and Voronoi modeling method, were used to validate the proposed pseudorandom based CPFE modeling method. Results show that the Pseudorandom model is better than existing advanced grain scale RVE models in terms of simulation efficiency, representativeness, strain rate stability, mesh density stability and truth proximity. In the end, this research provides a better grain scale RVE modeling method and can promote the progress of material characterization, processing and application for polycrystalline materials at micro-nanometer scale. © 2020 Elsevier Ltd
收录类别:EI;SCOPUS
资源类型:期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85079270649&doi=10.1016%2fj.mechmat.2020.103347&partnerID=40&md5=925584cc230be3fe2ac9d0c2b9d4c293
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