标题:Optical image processing technology in recognizing specific trace
作者:Wang, Yunshan ;Si, Shuchun ;Xu, Jianqiang ;Zhou, Canlin ;Gao, Chengyong
通讯作者:Wang, Y
作者机构:[Wang, Yunshan ;Si, Shuchun ;Xu, Jianqiang ;Zhou, Canlin ;Gao, Chengyong ] Inst. of Phys. and Microelectronics, Shandong University, Jinan 250061, Chi 更多
会议名称:Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002
会议日期:3 September 2002 through 6 September 2002
来源:Proceedings of SPIE - The International Society for Optical Engineering
出版年:2003
卷:5058
页码:554-558
DOI:10.1117/12.510312
关键词:Image Processing; Specific Trace; Trace Recognizing
摘要:The surface profile is presented various, that forming cause of the specific trace is different. The specific trace is districted as two types, from its criterion. First, the criterion of the specific trace is large, surpass a millimeter, is called grand specific trace; Second, the criterion is small, more or less the same length micron, is called micron specific trace. Using projection, contracting beam micrography, two-dimensions adjusting image mode exchange, low-pass filter off noise, wavelet, and intelligent mode phase reconstruction, the surface profile of recognizing specific trace is given exactly and rapidly, that is a new optical image processing technology in recognition and diagnosis. This paper introduced the speciality above the technology, and gave typical examples.
收录类别:EI;SCOPUS
资源类型:会议论文;期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-0042357473&doi=10.1117%2f12.510312&partnerID=40&md5=3a41b987850398eef7b51f21110e895e
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