标题:Investigation of CMOS pixel sensor with 0.18 μm CMOS technology for high-precision tracking detector
作者:Zhang, L. ;Fu, M. ;Zhang, Y. ;Yan, W. ;Wang, M.
通讯作者:Zhang, L
作者机构:[Zhang, L. ;Wang, M. ] School of Physics, Key Laboratory of Particle Physics and Particle Irradiation (MOE), Shandong University, Jinan; 250100, China 更多
来源:Journal of Instrumentation
出版年:2017
卷:12
期:1
DOI:10.1088/1748-0221/12/01/C01011
摘要:The Circular Electron Positron Collider (CEPC) proposed by the Chinese high energy physics community is aiming to measure Higgs particles and their interactions precisely. The tracking detector including Silicon Inner Tracker (SIT) and Forward Tracking Disks (FTD) has driven stringent requirements on sensor technologies in term of spatial resolution, power consumption and readout speed. CMOS Pixel Sensor (CPS) is a promising candidate to approach these requirements. This paper presents the preliminary studies on the sensor optimization for tracking detector to achieve high collection efficiency while keeping necessary spatial resolution. Detailed studies have been performed on the charge collection using a 0.18 μm CMOS image sensor process. This process allows high resistivity epitaxial layer, leading to a significant improvement on the charge collection and therefore improving the radiation tolerance. Together with the simulation results, the first exploratory prototype has bee designed and fabricated. The prototype includes 9 different pixel arrays, which vary in terms of pixel pitch, diode size and geometry. The total area of the prototype amounts to 2 × 7.88 mm2.
© 2017 IOP Publishing Ltd and Sissa Medialab srl.
收录类别:EI
资源类型:会议论文
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