标题:Analysis of interface trap states in InAlN/AlN/GaN heterostructures (vol 29, 095011, 2014)
作者:Zhou, Yang; Lin, Zhaojun; Luan, Chongbiao; Zhao, Jingtao; Yang, Qihao; Yang, Ming; Wang, Yutang; Feng, Zhihong; Lv, Yuanjie
作者机构:[Zhou, Yang; Lin, Zhaojun; Luan, Chongbiao; Zhao, Jingtao; Yang, Qihao; Yang, Ming; Wang, Yutang] Shandong Univ, Sch Phys, Jinan 250100, Peoples R Chi 更多
通讯作者:Zhou, Y
通讯作者地址:[Zhou, Y]Shandong Univ, Sch Phys, Jinan 250100, Peoples R China.
来源:SEMICONDUCTOR SCIENCE AND TECHNOLOGY
出版年:2014
卷:29
期:11
收录类别:SCIE
资源类型:期刊论文
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