标题：Studies on Temperature and Strain Sensitivities of a Few-mode Critical Wavelength Fiber Optic Sensor
作者：Lu C.; Su J.; Dong X.; Lua L.; Sun T.; Grattan K.T.V.
作者机构：[Lu, C] Institute of Lightwave Technology, School of Information Science and Technology, Xiamen University, Xiamen, Fujian 361005, China and School of 更多
来源：IEEE Sensors Journal
关键词：critical wavelength; few mode fiber; In-line Mach-Zehnder interferometer; Interference; Optical fiber sensors; Sensitivity; Strain; strain sensitivity; temperature sensitivity; Temperature sensors; Wavelength measurement
摘要：This paper studied the relationship between the temperature/strain wavelength sensitivity of a fiber optic in-line Mach-Zehnder Interferometer (MZI) sensor and the wavelength separation of the measured wavelength to the critical wavelength (CWL) in a CWL-existed interference spectrum formed by interference between LP01 and LP02 modes. The in-line MZI fiber optic sensor has been constructed by splicing a section of specially designed few-mode fiber (FMF), which support LP01 and LP02 modes propagating in the fiber, between two pieces of single mode fiber. The propagation constant difference, Δβ, between the LP01 and LP02 modes, changes non-monotonously with wavelength and reaches a maximum at the CWL. As a result, in sensor operation, peaks on the different sides of the CWL then shift in opposite directions, and the associated temperature/strain sensitivities increase significantly when the measured wavelength points become close to the CWL, from both sides of the CWL. A theoretical analysis carried out has predicted that with this specified FMF sensor approach, the temperature/strain wavelength sensitivities are governed by the wavelength difference between the measured wavelength and the CWL. This conclusion was seen to agree well with the experimental results obtained. Combining the wavelength shifts of the peaks and the CWL in the transmission spectrum of the SFS structure, this study has shown that this approach forms the basis of effective designs of high sensitivity sensors for multi-parameter detection and offering a large measurement range to satisfy the requirements needed for better industrial measurements. IEEE