标题:Simulation research for the effect of KDP crystal defect and initial internal stress on sawing stress
作者:Ge, Pei Qi ;Bi, Wen Bo ;Ge, Meng Ran ;Jiao, Yang ;Lu, Chang Hou
通讯作者:Ge, Pei Qi
作者机构:[Ge, Pei Qi ;Bi, Wen Bo ;Ge, Meng Ran ;Jiao, Yang ;Lu, Chang Hou ] School of Mechanical Engineering, Shandong University, Jinan; 250061, China;[Ge, Pe 更多
会议名称:19th International Symposium on Advances in Abrasive Technology, ISAAT 2016
会议日期:2 October 2016 through 5 October 2016
来源:Materials Science Forum
出版年:2016
卷:874
页码:9-14
DOI:10.4028/www.scientific.net/MSF.874.9
关键词:Crystal defect; Fixed abrasive wire saw; KDP (KH2PO4) crystal; Sawing process; Sawing stress
摘要:KDP (KH2PO4) crystal is a kind of excellent nonlinear optical crystals, which has been widely used in nonlinear optical and Inertial Confinement Fusion (ICF) engineering. KDP crystal with the characteristics of low hardness, high brittleness, easy deliquescence and temperature-sensitive is easy to crack during the crystal growth, taken out from crystallizer, and the process of slicing. Stress concentration caused by the initial internal stress redistribution and the growth defect in KDP crystal is an important reason of KDP crystal cracking during sawing process. The numerical simulation model of the KDP crystal containing spherical cavity defect and sawing with fixed abrasive wire saw is established by finite element method in this paper. The effects of initial internal stress, spherical cavity defect on sawing stress are investigated. The maximum tensile stress near the defect during the sawing process is simulated and analyzed. The results show that sawing stress changes smoothly during sawing process, and the fixed abrasive wire saw slicing belongs to low stress cutting way. The sawing stress at sawing kerf is increased obviously. The crystal defect leads to local stress concentration during sawing process. The coupling effect of sawing stress with initial internal stress and the effect of stress concentration are enhanced when the sawing kerf approaches to the defect. © 2016 Trans Tech Publications, Switzerland.
收录类别:EI;SCOPUS
资源类型:会议论文;期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84991581808&doi=10.4028%2fwww.scientific.net%2fMSF.874.9&partnerID=40&md5=2ca88e4c2bd52b59dd3c6c0a3fdbf1f7
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