标题:Theoretical Study on Binary Digital Speckle Power Spectrum [二值化数字散斑功率谱理论研究]
作者:Wu W.; Liu C.; Xu Z.; Liu X.
作者机构:[Wu, W] School of Science, Nanjing University of Science and Technology, Nanjing, Jiangsu 210094, China;[ Liu, C] School of Science, Nanjing Universi 更多
通讯作者:Liu, C(LiuC@njust.edu.cn)
通讯作者地址:[Liu, C] School of Science, Nanjing University of Science and TechnologyChina;
来源:Guangxue Xuebao/Acta Optica Sinica
出版年:2020
卷:40
期:3
DOI:10.3788/AOS202040.0312002
关键词:Binary speckle; Measurement; Power spectrum; Theoretical analysis; Wiener-Khintchine theorem
摘要:The key in the quality evaluation of the speckle is to construct model which can describe the relation between speckle pattern feature parameters and measurement error of digital image correlation method. Till date, no theoretical analysis model describing the relation between the speckle pattern and its power spectrum has been reported. To address this issue and considering the perspective of stochastic process analysis, the relations between the auto-correlation function of the binary speckle and parameters of speckle duty, speckle radius, and gray value are investigated herein. Furthermore, the theoretical analytical form of the binary speckle power spectrum is obtained according to the Wiener-Khintchine theorem. Finally, the theoretical analysis results are verified by numerical experiments. It is observed that the theoretically derived results are consistent with the numerical experiment results on the main lobe of the power spectrum and on several side-lobes nearby. Considering the power spectrum, the maximum value of the main spectrum is consistent with the experimental results. This model can be applied to subsequent speckle error analysis studies. © 2020, Chinese Lasers Press. All right reserved.
收录类别:SCOPUS
资源类型:期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85082470780&doi=10.3788%2fAOS202040.0312002&partnerID=40&md5=ee2ff727b51a78c519f05362a7199e15
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