标题:Machining behaviors of vibration-assisted electrical arc machining of W9Mo3Cr4V
作者:Zhu, Guang; Zhang, Min; Zhang, Qinhe; Song, ZhenChao; Wang, Kan
作者机构:[Zhu, Guang; Zhang, Qinhe; Wang, Kan] Shandong Univ, Sch Mech Engn, Key Lab High Efficiency & Clean Mech Manufacture, Minist Educ, 17923 Jingshi Rd, J 更多
通讯作者:Zhang, Qinhe
通讯作者地址:[Zhang, QH]Shandong Univ, Sch Mech Engn, Key Lab High Efficiency & Clean Mech Manufacture, Minist Educ, 17923 Jingshi Rd, Jinan 250061, Shandong, Peop 更多
来源:INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
出版年:2018
卷:96
期:1-4
页码:1073-1080
DOI:10.1007/s00170-018-1622-9
关键词:Vibration-assisted electrical arcmachining; Material removal rate;; Electrode wear rate; Relative electrode wear ratio; Surface roughness
摘要:Vibration-assisted electrical discharge machining (VEDM) is an effective electro-machining technology, suitable for machining all types of conductive materials regardless of strength or hardness. However, the low material removal rate (MRR) limits the application of VEDM. To improve the processing efficiency, the present study implemented electrical arc machining into VEDM and generated a novel method named vibration-assisted electrical arc machining (VEAM). The influences of vibration on the performances of VEAM are studied, and an orthogonal experiment was designed and conducted to explore the effects of processing parameters on the machining behaviors. The results indicate that the discharge status could be improved and the MRR increases via the superposition of vibration. The peak current is responsible for MRR in the machining process, while peak current and spindle speed are the dominant affecting factors on electrode wear rate (EWR), while the effects of flushing pressure and peak current are responsible for surface roughness (Rz). Additionally, higher pulse voltage leads to higher MRR, and lower TWR and relative electrode wear ratio (REWR). The MRR, TWR, REWR, and Rz decrease with increasing flushing pressure.
收录类别:EI;SCOPUS;SCIE
资源类型:期刊论文
原文链接:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85044787738&doi=10.1007%2fs00170-018-1622-9&partnerID=40&md5=b51aa59fb93ae6f268125d94c9017975
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